Open Access Journal

ISSN : 2394 - 6849 (Online)

International Journal of Engineering Research in Electronics and Communication Engineering(IJERECE)

Monthly Journal for Electronics and Communication Engineering

Open Access Journal

International Journal of Engineering Research in Electronics and Communication Engineering(IJERECE)

Monthly Journal for Electronics and Communication Engineering

ISSN : 2394-6849 (Online)

A Fault-Tolerant Memory System for Nano-Memory Applications

Author : Pradeep Kalakoti 1 Kalakoti. Kalyan 2

Date of Publication :22nd February 2018

Abstract: Due to the increase in the soft error rate in logic circuits, the encoder and decoder circuitry around the memory blocks have become susceptible to soft errors as well and must also be protected. We introduce a new approach to design fault-secure encoder and decoder circuitry for memory designs. Hamming codes are often used in today’s memory systems to correct a single error and detect double errors in any memory word. In these memory architectures, only errors in the memory words are tolerated and there is no preparation to tolerate errors in the supporting logic (i.e. encoder and corrector). However combinational logic has already started showing susceptibility to soft errors, and therefore the encoder and decoder (corrector) units will no longer be immune from the transient faults. Therefore, protecting the memory system support logic implementation is more important. Here we proposed a fault tolerant memory system that tolerates multiple errors in each memory word as well as multiple errors in the encoder and corrector units. We illustrate using Euclidean Geometry codes and Projective Geometry codes to design the fault-tolerant memory system, due to their well-suited characteristics for this application.

Reference :

    1. Shu Lin and Daniel J. Costello. Error Control Coding. Prentice Hall, second edition, 2004.
    2. R. G. Gallager, “Low-density parity-check codes”, IRE Trans. Information Theory, vol. IT-8, no. 1, pp. 21–28, January 1962.
    3. D. J. C. MacKay and R. M. Neal, “Near Shannon limit performance of low density parity check codes”, Electronics Letters, vol. 32, no. 18, pp. 1645–1646, March 1997.
    4. R. J. McEliece, The Theory of Information and Coding. Cambridge, U.K.: Cambridge University Press, 2002.
    5. M. Sipser and D. Spielman, “Expander codes,” IEEE Trans. Inf. Theory, vol. 42, no. 6, pp. 1710–1722, Nov. 1996.
    6. D. E. Knuth, The Art of Computer Programming, 2nd ed. Reading, MA: Addison Wesley, 2000.
    7. Allen D. Holliday, Hamming Error-Correction Codes, February 17, 1994 (revised June 15, 2002; March 1, 2004).
    8. H. Tang, J. Xu, S. Lin, and K. A. S. Abdel-Ghaffar, “Codes on finite geometries,” IEEE Trans. Inf. Theory, vol. 51, no. 2, pp. 572–596, Feb. 2005.
    9. H. Naeimi and A. DeHon, “Fault-tolerant nanomemory with fault secure encoder and decoder,” presented at the Int. Conf. Nano-Netw.,Catania, Sicily, Italy, Sep. 2007.
    10. S. J. Piestrak, A. Dandache, and F. Monteiro, “Designing fault-secure parallel encoders for systematic linear error correcting codes,” IEEE Trans. Reliab., vol. 52, no. 4, pp. 492–500, Jul. 2003.
    11. G. C. Cardarilli et al. Concurrent error detection in reed-solomon encoders and decoders. IEEE Trans. VLSI, 15:842–826, 2007.
    12. Hamming, Richard W., “Error Detecting and Error Correcting Codes,” The Bell System Technical Journal 26, 2 (April 1950), 147–160.
    13. Hill, Raymond. A First Course in Coding Theory. Clarendon Press,1986.
    14. W. W. Peterson and E. J. Weldon, Jr., ErrorCorrecting Codes, 2nd Ed. Cambridge, MA: M.I.T. Press, 1972.
    15. L. Edwards, “Low cost alternative to Hamming codes corrects memory errors,” Cornput. Des., pp. 132-148, July 1981.
    16. Y. Kou, S. Lin and M. Fossorier, Low density parity check codes based on _nite geometries: a rediscovery and more," IEEE Trans. Inform. Theory, vol. 47, pp. 2711-2736, Nov. 2001.

Recent Article