International Journal of Engineering Research in Electronics and Communication Engineering(IJERECE)

Monthly Journal for Electronics and Communication Engineering

Volume2,November 2015,

Topic : An Integrated IVCCRL Approach for the reduction of Negative Bias Temperature Instability in an AES Core

Authors:Anitha Patibandla || Dr.B.L.Raju

Abstract:Reliability of Circuits is one of the major concerns in VLSI circuits and systems designs. Negative Bias Temperature Instability(NBTI), which has a deteriorating effect on the threshold voltage and the drive current of semiconductor devices, is emerging as a major reliability degradation mechanism [1].An important Reliability issue in the recent times is the Negative bias temperature instability (NBTI) in the MOS circuits in Cryptographic cores. Many works propose hardware implementations of cryptographic primitives with the promise of reduction in area, power dissipation and cost. An integrated IVCCRL approach for the reduction of Negative Bias Temperature Instability in an AES Core using the techniques of Input Vector Control (IVC) and Reversible Logic (RL) is being proposed in this paper. The effect of input vector control investigated. Mini-mum leakage vectors, which lead to minimum circuit performance degradation and maximum leakage reduction rate, are selected and used when the circuit is in the standby mode. Analysis on the potential to save the circuit performance degradation by internal node control techniques during circuit standby mode is discussed. The optimization is done for the AES algorithm using NCL Reversible Gates for low power, low cost and low area. Simulation Results have been analyzed and presented..

Keywords: NCL, Reversible Logic, AES, NBTI

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DOI: 01.1617/vol2iss11pid083

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Dr.Zhongfu Tan
National Professor,
North China Electric Power University,

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ISSN(Online): 2394-6849

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Thomson Reuters ID : q-6288-2016.
ORCiD Research ID : 0000-0001-9540-6799

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Journal Code : IJERECE
Electronic ISSN : 2394-6849
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