Open Access Journal

ISSN : 2394 - 6849 (Online)

International Journal of Engineering Research in Electronics and Communication Engineering(IJERECE)

Monthly Journal for Electronics and Communication Engineering

Open Access Journal

International Journal of Engineering Research in Electronics and Communication Engineering(IJERECE)

Monthly Journal for Electronics and Communication Engineering

ISSN : 2394-6849 (Online)

Reference :

  1. [1] Esmaeil Faramarzi, Member, IEEE, Dinesh Rajan, Senior Member, IEEE, and Marc P. Christensen, Senior Member, IEEE, “Unified Blind Method for Multi-Image SuperResolution and Single/Multi-Image Blur Deconvolution”, IEEE Transactions on Image Processing, VOL. 22, NO. 6, JUNE 2013

    [2] A. Geetha Devi, T. Madhu and K. Lal Kishore, “An Improved Super Resolution Image Reconstruction using SVD based Fusion and Blind Deconvolution techniques”, International Journal of Signal Processing, Image Processing and Pattern Recognition ol.7, No.1 (2014), pp.283-298

    [3] S.K. Satpathy, S.K. Nayak, K.K Nagwanshi, S. Panda, C. Ardil, “An Adaptive Model for Blind Image Restoration using Bayesian Approach”, International Journal of Computer, EEC Engg V0l:4, No:1,2010.

    [4] A. Shakul Hamid, S.P. Victor, “Experimental Implementation of Image Restoration Schema using Inverse Filter Processing Techniques”, International Journal of Engg and Computer Science ISSN:2319-7242.Vol 4 Issue April 2015, Page no. 11219-11223.

    [5] B Chopade and P M Patil, “Single and Multi Frame Image Super-Resolution and its Performance Analysis: A Comprehensive Survey”, International Journal of Computer Applications (0975 – 8887) Volume 111 – No 15, February 2015.

    [6] Pandya Hardeep, Prof. Prashant B. Swadas, Prof. Mahasweta Joshi, “A Survey on Techniques and Challenges in Image Super Resolution Reconstruction”, International Journal of Computer Science and Mobile Computing ISSN 2320–088X IJCSMC, Vol. 2, Issue. 4, April 2013, pg.317 – 325.

    [7] Min-Chun Yang and Yu-Chiang Frank Wang, Member, IEEE,“A Self-Learning Approach to Single Image SuperResolution ”, IEEE transactions on multimedia, vol. 15, no. 3, april 2013.

    [8] Simon Baker and Takeo Kanade, “Limits on SuperResolution and How to Break Them”, to Appear in the IEEE Transactions on Pattern Analysis and Machine Intelligence, The Robotics Institute Carnegie Mellon University Pittsburgh, PA 15213


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