Open Access Journal

ISSN : 2394 - 6849 (Online)

International Journal of Engineering Research in Electronics and Communication Engineering(IJERECE)

Monthly Journal for Electronics and Communication Engineering

Open Access Journal

International Journal of Engineering Research in Electronics and Communication Engineering(IJERECE)

Monthly Journal for Electronics and Communication Engineering

ISSN : 2394-6849 (Online)

Implementation of Fault Tolerant Embedded Signature Analyzer

Author : Amol Gulab Patil 1 Usha Jadhav 2

Date of Publication :17th August 2017

Abstract: To test and verify arithmetic and logic operations performed by digital circuits an arithmetic and algebraic codes are used. Residue generator is an important unit of hardware implementation of arithmetic code which generates residue of number with respect to check base. The proposed system uses residue generator with arbitrary check base. It is shown that to reduce the probability of error escape, when proposed residue generator is used for detecting arithmetic errors. The proposed generator is embed into a microprogrammable finite state machine to test its operation without adding hardware overhead. The proposed method can be used in arithmetic/algebraic error-control and fault-tolerant digital designs.

Reference :

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    [4] A. Chandra and K. Chakrabarty, “System-on-achip test-data compression and decompression architectures based on Golomb codes,'' IEEE Trans. Comput.-Aided Design Integr. Circuits Syst., vol. 20, no. 3, pp. 355_368, Mar. 2001.

    [5] M. Ottavi, G. C. Cardarilli, D. Cellitti, S. Pontarelli, M. Re, and A. Salsano, “Design of a totally self checking signature analysis checker for finite state machines,'' in Proc. IEEE Int. Symp. Defect Fault Tolerance VLSI Syst., Oct. 2001, pp. 403_411. 

    [6] U. Sparmann and S. M. Reddy, “On the effectiveness of residue code checking for parallel two's complement multipliers,'' IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 4, no. 2, pp. 227_239, Jun. 1996.

    [7] J. Duran and T. E. Mangir, “A design approach for a microprogrammed control unit with built in self test,'' ACM SIGMICRO Newslett., vol. 14, no. 4, pp. 55_60, Dec. 1983.


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