Open Access Journal

ISSN : 2394 - 6849 (Online)

International Journal of Engineering Research in Electronics and Communication Engineering(IJERECE)

Monthly Journal for Electronics and Communication Engineering

Open Access Journal

International Journal of Engineering Research in Electronics and Communication Engineering(IJERECE)

Monthly Journal for Electronics and Communication Engineering

ISSN : 2394-6849 (Online)

Detection and Classification of soybean leaf diseases using K-means Clustering

Author : Sachin B. Jadhav 1 Dr.Sanjay B. Patil 2

Date of Publication :26th April 2018

Abstract: Soybean Blight Brown Spot, Soybean powdery mildew and Downy Mildew are most common destructive foliar diseases of soybean and can cause significant yield loss. Timely application of fungicide, in the early stage of fungal infection, is important for effective control of the disease and is largely dependent upon the capability to quantitatively detection of the infection. The main purpose of this work is to identify and classify the soybean leaf disease based on the symptoms that are visible in leaf image. In this paper, Color-based segmentation method (K-means clustering) has been in corporate for separating the infected region from the leaf image. The infected stains are characterized by the features like color and textures. In the classification phase the color co-occurrence features, based on SGDM, are extracted and compared with the corresponding feature values stored in the feature library

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