Author : Shruthi S 1
Date of Publication :7th May 2016
Abstract: Technology in VLSI industry has improved in accordance with moore’s law , so density of transistor in Integrated Circuit(IC) is increased . Testing this IC with the bed of nail technique becomes very difficult so solution to this was given by IEEE 1149.1 boundary scan standard also called as Joint Test Access Group(JTAG) using which interconnects between the IC mounted on PCB was tested without physical access. The JTAG Test Access Port(TAP) was used for additional purposes in industry to access the embedded instruments within in the semiconductor device so to standardize the method to access, test, debug, configure and monitor IEEE 1687 standard was developed. This IEEE 1687 standard also called as Internal test Access Group(IJTAG).In this paper the IEEE 1687 is implemented in verilog and simulated in Xilinx 13.1 ISE sim and synthesized using RTL complier in 180nm technology library.
Reference :
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[1] IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device, IEEE STD 1687, November 2014(Approved).
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