Author : Hema G D 1
Date of Publication :7th May 2016
Abstract: Built in Self Test is one of the widely used methods for memory testing and it is the cost effective method. The fault in the memory is due to the complexity of the design rules. For complex applications, the memories without faults are necessary. There are many test algorithms for testing of memories, march based tests are the dominant testing algorithms due to simplicity and ability to test the faults. Because of this, march tests are implemented in most modern memories BIST. In this project, by considering optimized march-c algorithm to test the faults. This algorithm uses the concurrent technique. Because of concurrency the testing time is reduced compared to basic march c algorithm. This technique is applied to 256x8 memories it can be extended to any size. For the effectiveness of this algorithm, Built-in selftest technique is considered to test embedded memory of the FPGA.
Reference :
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